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そうさがたでんしけんびきょう 走査型電子顕微鏡
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Noun
1. scanning electron microscope; SEM​
Wikipedia definition
2. Scanning electron microscope​A scanning electron microscope (SEM) is a type of electron microscope that images a sample by scanning it with a beam of electrons in a raster scan pattern. The electrons interact with the atoms that make up the sample producing signals that contain information about the sample's surface topography, composition, and other properties such as electrical conductivity.
Read “Scanning electron microscope” on English Wikipedia
Read “走査型電子顕微鏡” on Japanese Wikipedia
Read “Scanning electron microscope” on DBpedia

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