集束イオンビーム
1. Focused ion beamFocused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. An FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, an FIB setup uses a focused beam of ions instead.
Read “Focused ion beam” on English Wikipedia
Read “集束イオンビーム” on Japanese Wikipedia
Read “Focused ion beam” on DBpedia
Read “Focused ion beam” on English Wikipedia
Read “集束イオンビーム” on Japanese Wikipedia
Read “Focused ion beam” on DBpedia
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