走査型プローブ顕微鏡
1. Scanning probe microscopyScanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position. SPM was founded with the invention of the scanning tunneling microscope in 1981. Many scanning probe microscopes can image several interactions simultaneously.
Read “Scanning probe microscopy” on English Wikipedia
Read “走査型プローブ顕微鏡” on Japanese Wikipedia
Read “Scanning probe microscopy” on DBpedia
Read “Scanning probe microscopy” on English Wikipedia
Read “走査型プローブ顕微鏡” on Japanese Wikipedia
Read “Scanning probe microscopy” on DBpedia
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