けんびきょう
イオン顕微鏡
1. ion microscope
2. Field ion microscopeField ion microscopy (FIM) is an analytical technique used in materials science. The field ion microscope is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip. It was the first technique by which individual atoms could be spatially resolved.
Read “Field ion microscope” on English Wikipedia
Read “イオン顕微鏡” on Japanese Wikipedia
Read “Field ion microscope” on DBpedia
Read “Field ion microscope” on English Wikipedia
Read “イオン顕微鏡” on Japanese Wikipedia
Read “Field ion microscope” on DBpedia
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