微分干渉顕微鏡
1. Differential interference contrast microscopyDifferential interference contrast microscopy (DIC), also known as Nomarski Interference Contrast (NIC) or Nomarski microscopy, is an optical microscopy illumination technique used to enhance the contrast in unstained, transparent samples. DIC works on the principle of interferometry to gain information about the optical path length of the sample, to see otherwise invisible features.
Read “Differential interference contrast microscopy” on English Wikipedia
Read “微分干渉顕微鏡” on Japanese Wikipedia
Read “Differential interference contrast microscopy” on DBpedia
Read “Differential interference contrast microscopy” on English Wikipedia
Read “微分干渉顕微鏡” on Japanese Wikipedia
Read “Differential interference contrast microscopy” on DBpedia
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